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Random telegraph noise in the photon emission from semiconductor quantum dots

机译:半导体量子点光子发射中的随机电报噪声

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This study has observed and investigated random telegraph noise in the photoluminescence from InAs quantum dots in GaAs and InP quantum dots in GaInP. The dots are grown by the Stranski-Krastanow technique with a sufficiently low surface density that individual dots easily could be investigated. The luminescence from many single quantum dots, exhibiting switching between two levels, has been spectrally resolved as a function of time. The random telegraph noise is only observed in the presence of band filling. Results show no spectral shift of the emission in the different states. It is only the intensity, mainly for higher energy peaks that changes. The InAs quantum dots behave very similarly to InP/GaInP and InGaAs/GaAs quantum dots with respect to random telegraph noise. The similarities between the different systems argue for a common mechanism behind the blinking. Experiments are performed where the switching behaviour is changed in all the different systems supporting the idea that non-radiative defects are responsible.
机译:这项研究已经观察并研究了GaAs中InAs量子点和GaInP中InP量子点的光致发光中的随机电报噪声。通过Stranski-Krastanow技术生长的点具有足够低的表面密度,因此可以轻松研究单个点。从许多单个量子点发出的光显示出在两个能级之间的切换,已被光谱解析为时间的函数。仅在出现频段填充的情况下才能观察到随机电报噪声。结果表明,在不同状态下,发射没有光谱偏移。强度只是变化,主要是对于较高的能量峰。就随机电报噪声而言,InAs量子点的行为与InP / GaInP和InGaAs / GaAs量子点非常相似。不同系统之间的相似之处表明存在闪烁的共同机制。在所有不同的系统中都进行了改变开关行为的实验,从而证明了非辐射缺陷是负责任的。

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