silicon; elemental semiconductors; indium compounds; gallium arsenide; III-V semiconductors; infrared spectra; goniometers; semiconductor lasers; photodetectors; infrared detectors; monochromators; optical windows; optical fibres; NIST near infrared emittance measurement system; NIST Infrared Spectrophotometry Laboratory; rapid thermal processing; reflectance; transmittance; oxidation; diode lasers; halogen lamp; radiation sources; optical windows; fiber optics; platinum-ceramic element; semiconductor wafer; bare silicon; silicon substrates; polysilicon films; 600 to 2300 nm; 800 degC; Si; InGaAs;
机译:使用重合微波和红外测量反演陆地上的微波表面辐射
机译:一种在红外波长范围内测量纸张定向发射率的方法
机译:使用NIST标准参考光度计进行臭氧摩尔分数测量中的系统偏差和测量不确定度的研究
机译:NIST近红外线发射测量系统的状态
机译:NIST可追踪射频衰减测量系统
机译:NIST高精度红外分光光度计的测波系统的开发
机译:加利福尼亚莫诺火山口地区岩石的其他红外光谱发射率测量