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A new dynamic, self-consistent electro-thermal model of power HBTs and a novel interpretation of thermal collapse loci in multi-finger devices

机译:功率HBT的新动态,自洽电热模型以及多指设备中热塌陷轨迹的新颖解释

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A new self-consistent dynamic electro-thermal model for power HBTs is presented coupling a circuit-oriented electrical model fitted on experimental data with a full frequency domain thermal model. The thermal model provides the exact frequency behaviour of the device thermal impedance through a quasi-3D approach, rather than a simple single- or multi-pole rational approximation. The self-consistent solution is achieved, in large-signal periodic conditions, through harmonic balance analysis. The dynamic model enables us to discuss the behaviour of thermal collapse in multi-finger devices not only in DC, but also in AC conditions. In particular, a new interpretation is proposed for the thermal collapse loci of such devices in terms of bifurcations, thus providing a simpler and more straightforward stability criterion with respect to those already presented in the literature.
机译:提出了一种针对功率HBT的新的自洽动态电热模型,该模型将基于实验数据的面向电路的电模型与全频域热模型相结合。该热模型通过准3D方法而不是简单的单极或多极有理逼近来提供器件热阻的确切频率行为。通过谐波平衡分析,可以在大信号周期条件下实现自洽解决方案。动态模型使我们能够讨论多指器件的热塌陷行为,不仅是在直流条件下,而且还在交流条件下。尤其是,针对这种装置的热崩溃轨迹,提出了一种新的解释,即分叉,从而相对于文献中已经提出的稳定性标准提供了一种更简单,更直接的稳定性标准。

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