首页> 外文会议> >Characterization of CVD diamond film and diamond-tip field emitter array for FED applications
【24h】

Characterization of CVD diamond film and diamond-tip field emitter array for FED applications

机译:用于FED应用的CVD金刚石膜和金刚石尖端场发射器阵列的表征

获取原文

摘要

Diamond-tip field emitter arrays and a flat diamond films were fabricated and characterized. The tip radius of 300 A was obtained by using a silicon mold formed by orientation dependent etching (ODE). The fabricated diamond-tip array was identified as diamond from Raman spectroscopy. Emission current of 200 /spl mu/A and threshold voltage of 600 V were obtained for the diamond-tip field emitter arrays from the current-voltage measurement. Emission current of 6 /spl mu/A and threshold voltage of 800 V were obtained from the flat diamond film deposited under the same condition as diamond-tip field emitter arrays. The diamond-tip field emitter arrays were shown to have better electrical characteristics than the flat diamond films.
机译:制作并表征了金刚石尖端场发射器阵列和平坦的金刚石膜。通过使用通过取向依赖蚀刻(ODE)形成的硅模具获得300 A的尖端半径。从拉曼光谱法鉴定出所制造的金刚石尖端阵列为金刚石。对于金刚石尖端场发射器阵列,通过电流-电压测量获得了200 / spl mu / A的发射电流和600 V的阈值电压。从在与金刚石尖端场发射器阵列相同的条件下沉积的平坦金刚石膜获得6s /splμu/ A的发射电流和800V的阈值电压。示出了金刚石尖端场发射器阵列具有比平坦金刚石膜更好的电特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号