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An exact analysis of the impact of fading correlation on the average level crossing rate and average outage duration of selection combining

机译:衰落相关性对选择组合的平均电平穿越率和平均中断持续时间的影响的精确分析

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This paper derives the average level crossing rate (LCR) and the average outage duration (AOD) of selection combining (SC) over correlated and/or unbalanced channels. More specifically, it presents a general approach for the analysis of such systems operating over correlated Rayleigh, Rician, and/or Nakagami fading channels. The general approach is then applied to obtain generic closed-form expressions for the LCR and AOD of dual-branch SC in a correlated Rayleigh and Nakagami fading environment. The results obtained as special cases of the offered generic closed-form expressions are compared to those previously reported in the literature. Finally, some numerical examples comparing the LCR and AOD of SC with various value of fading correlation, average fading power unbalance, and Nakagami parameter are provided and discussed.
机译:本文推导了相关和/或不平衡通道上的选择组合(SC)的平均水平穿越率(LCR)和平均中断时间(AOD)。更具体地说,它提供了一种用于分析在相关瑞利,里奇安和/或中神衰落信道上运行的此类系统的通用方法。然后将通用方法应用于在相关的瑞利和中上衰落环境中获得双分支SC的LCR和AOD的通用闭式表达式。将所提供的通用封闭格式表达式的特殊情况下获得的结果与文献中先前报道的结果进行比较。最后,提供了一些数值示例,将SC的LCR和AOD与各种衰落相关值,平均衰落功率不平衡和Nakagami参数进行了比较。

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