Development of automatic diagnostic test system for mixed-signal/analog integrated circuits

摘要

This system for mixed-signal/analog integrated circuits is divided into off-line test program development process and on-line test application process. During the off-line development phase, generated test programs are described by using HDL-A and simulation tools, and validated by a test system interfacing the unit under test, where Labview, a general-purpose programming tool, is used as a virtual instrument.