IVESTIGATIONS OF RANDOM PYRAMID TEXTURE ON THE SURFACE OF SINGLE-CRYSTALLINE SILICON FOR SOLAR CELLS

摘要

The reflectance of crystalline silicon wafer with a random pyramid textured surface has been studied. The texturization was carried out in an alkaline aqueous solution. The reflection mostly happens on the mirror-like Si {111} surfaces and dominated by a special approach which theoretically predicts a better antireflective performance than the comparable V-grooves and periodic upright pyramids. The enhanced reflectance for the practical random pyramids is analyzed. The different loss contributions due to a nonideal pyramid structure are also discussed.