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A novel approach to evaluate the carrier effective mass in GeSi quantum dot structure

机译:一种评估GeSi量子点结构中载流子有效质量的新方法

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Carrier effective mass in the self-assembled GeSi quantum dots (QDs) grown by a solid-source molecular beam epitaxy (MBH) system has been studied with temperature-dependent photoluminescence (PL) and Raman scattering measurements. The temperature-dependence of the PL was fitted by the combination of Arrhenius and Berthelot type functions, from which a novel approach to evaluate the carrier effective mass has been proposed.
机译:通过与温度相关的光致发光(PL)和拉曼散射测量,研究了通过固体源分子束外延(MBH)系统生长的自组装GeSi量子点(QD)中的载流子有效质量。 PL的温度依赖性通过Arrhenius和Berthelot类型函数的组合来拟合,由此提出了一种评估载体有效质量的新方法。

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