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Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression

机译：改善压缩率，面积开销和测试应用时间，以进行片上系统测试数据压缩/解压缩

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《》|2002年|P.604-611|共8页
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Gonciari; P.T.; Al-Hashimi; B.M.; Nicolici; N.;
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中图分类无线电电子学、电信技术;
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1. 片上系统测试数据压缩的优化型FDR编码机制 [J] . 张颖, 吴宁, 葛芬南京航空航天大学学报（英文版） . 2012,第001期
2. System-On-a-Chip Test Data Compression and Decompression with Reconfigurable Serial Multiplier [J] . S.Sivanantham, Padmavathy M, Divyanga S, International Journal of Engineering and Technology . 2013,第2期

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3. Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead [J] . Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2010,第6期

机译：改进的选择性霍夫曼编码，可优化测试数据压缩，测试应用时间和面积开销
4. Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead [J] . Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee Journal of Electronic Testing . 2010,第6期

机译：改进的选择性霍夫曼编码，可优化测试数据压缩，测试应用时间和面积开销
5. Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression [C] . P. Gonciari, B. Al-Hashimi, N. Nicolici International conference on computer systems and technologies and workshop for PhD students in computing 2009 . 2009

机译：改善单芯片系统测试数据压缩/解压缩的压缩率，面积开销和测试应用时间
6. Reducing test data volume for system-on-chip integrated circuits using test data compression and built-in self-test. [D] . Li, Lei. 2004

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7. Dataset for time-lapse ultrasonic tomography of a granite slab under uniaxial compression test [O] . Qi Zhao, Tai-Ming He, Johnson Ha, 2018

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8. Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression [O] . Paul Theo Gonciari, Bashir M Al-hashimi 2002

机译：改善单芯片系统测试数据压缩/解压缩的压缩率，面积开销和测试应用时间

Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression

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