Low hardware overhead scan based 3-weight weighted random BIST

摘要

Two noble scan based BIST architectures, namely parallel fixing and serial fixing BIST, which can be implemented at very low hardware cost even for random pattern resistant circuits that have large number of scan elements, are proposed. Both of the proposed BIST schemes use 3-weight weighted random BIST techniques to reduce test sequence lengths by improving detection probabilities of random pattern resistant faults. A special ATPG is used to generate suitable test cube sets that lead to BIST circuits that require minimum hardware overhead. Experimental results show that the proposed BIST schemes can attain 100% fault coverage for all of benchmark circuits with drastically reduced test sequence lengths. This reduction in test sequence length is achieved at low hardware cost even for benchmark circuits that have large number scan inputs.