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Bridging the gap between low-cost general purpose electronic test equipment and high cost ATE

机译:缩小低成本通用电子测试设备与高成本ATE之间的差距

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This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military.
机译:本文介绍了一些用于电路卡测试和修复的常用方法。检查高端和低端技术,准备探索可以增强的中档功能的方法。对于大多数零件电路卡修复,使用低成本通用电子测试设备(GPete)或高成本的自动测试设备(ATE)利用测试程序集(TPS)进行。虽然这两种方法都具有它们的优点,但它们在所使用的技术和实际方面之间留下差距。本文突出了美国政府各分支机构采用的替代方法,以增加军队内的修复能力。

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