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Internal spatial modes of one-dimensional photonic bandgap devices imaged with near-field scanning optical microscopy

机译:近场扫描光学显微镜成像的一维光子带隙器件的内部空间模式

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Photonic bandgap (PBG) devices have been used to improve optoelectronic device performance through modification of spontaneous emission and are currently of much interest due to the control of the photonic state, which incorporated defects can provide. The concept of defect localized photon states has led to the design of structures that guide light on the nanometer scale. Near-field scanning optical microscopy length band-edge transmission spectra of a sample consisting of four air gaps on each side of a central defect with a 400-nm periodicity is displayed. The topographic image, taken simultaneously with the 856-nm data set, is used to correlate the spatial modes to the PEG structure.
机译:光子带隙(PBG)器件已用于通过自发发射的改进来提高光电子器件的性能,并且由于对光子状态的控制,目前引起了人们的极大关注,其中引入了缺陷。缺陷局部光子状态的概念导致了在纳米尺度上引导光的结构的设计。显示样品的近场扫描光学显微镜长度带边缘透射光谱,该样​​品由中心缺陷每一侧的四个气隙组成,周期为400 nm。与856 nm数据集同时拍摄的地形图用于将空间模式与PEG结构相关联。

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