This paper, for the first time, describes the analytical expressions which explicitly relate single-cell characteristics to Flash array behaviour including statistical consideration. Since the bitline leakage current caused by over-erased cells and/or broad threshold voltage (Vt) distribution generates read/verify circuitry malfunctions and a degraded programming due to voltage drop, and charge-pump circuitry failure, this leakage are extensively analyzed to find the optimum operation biases, array Vt design, their allowed variations and bitline segmentation in the scaled multilevel cell generation.
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