Quasi-simultaneous external electrooptic probing of transverse and longitudinal field distributions taking into account the probe tip invasiveness

摘要

A versatile electrooptic measurement setup facilitates the direct probing of circuits on electrooptic substrates and on arbitrary substrates by employing an external probe tip of a specific crystal-cut that allows the quasi-simultaneous probing of transverse and quasi-longitudinal electric field components. Employing the presented quasi-simultaneous measurements and the theoretical methods, the determined change in intensity of the transmitted laser beam can be used for the implementation of correction algorithms in the space-domain and time-domain. As examples we use microstrip lines and coupled microstrip transmission lines.