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Edge detection using orthogonal moment-based operators

机译:使用基于正交矩的算子进行边缘检测

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Presents a new approach to detect step edges with subpixel accuracy. The proposed approach is based on a set of orthogonal complex moments of the image known as Zernike moments. An ideal 2-D step edge is modeled in terms of four parameters: the background gray level, the step size, the distance of the edge from the center of the mask, and the orientation of the edge. Discrete Zernike moments are used to obtain a total of three masks to compute all the edge parameters for subpixel detection. For pixel-level edge detection only two masks (one real and one complex) are required. The theoretical analysis of the influence of noise on the location and the orientation of an edge is presented. This analysis reveals that the accuracy of the proposed approach is virtually unaffected by the additive noise. Experimental results are presented to demonstrate the efficacy of the proposed technique.
机译:提出了一种以亚像素精度检测台阶边缘的新方法。所提出的方法是基于一组称为Zernike矩的正交正交矩。理想的二维阶梯边缘是根据四个参数建模的:背景灰度,步长大小,边缘与蒙版中心的距离以及边缘的方向。离散的Zernike矩用于获得总共三个遮罩,以计算用于子像素检测的所有边缘参数。对于像素级边缘检测,仅需要两个掩模(一个实数和一个复数)。提出了噪声对边缘位置和方向影响的理论分析。该分析表明,所提出方法的准确性实际上不受附加噪声的影响。提出了实验结果以证明所提出的技术的有效性。

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