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Development of novel architecture and assembly techniques for a detector unit for a silicon micro-vertex detector using the flip-chip bonding method

机译:使用倒装芯片键合方法开发用于硅微顶点检测器的检测器单元的新颖架构和组装技术

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Full-size models of a detector unit for a silicon microvertex detector for the KEK B factory have been built. The model consists of four dummy double-sided, double-metal silicon microstrip detectors and two silicon end-boards mounted with dummy readout VLSIs on both sides. In this trial the flip-chip bonding method, using an anisotropic conductive film, is applied to both sides of the detector unit to bond 640 strips at a pitch of 50 mu m.
机译:已经建立了用于KEK B工厂的硅微顶点检测器的检测器单元的全尺寸模型。该模型包括四个虚拟的双面,双金属硅微带线检测器和两个硅质的端板,两侧均安装了虚拟的读出VLSI。在该试验中,使用各向异性导电膜的倒装芯片键合方法应用于检测器单元的两侧,以间距为50μm粘合640条。

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