首页> 外文会议> >Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits
【24h】

Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits

机译:通过使用线性MOSFET放大器和栅极驱动电路中的受控雪崩来提高GTO晶闸管的可靠性

获取原文

摘要

The controlled linear amplifier described has been shown to provide safe and reliable gate turn-off waveforms which may be easily adapted to the circuit conditions. The low impedance coaxial gate connections enhance the performance of the circuit and allow a greater degree of control than is possible using standard wired arrangements. For large GTOs, where the turn-off current may be in excess of 3000 A, both the coaxial connections and a controlled turn-off circuit are desirable for reliable operation. Device reliability and uniform turn-off over the whole silicon area can be ensured by use of gains lower than those typically specified in manufacturers data sheets. With turn-off gains of less than one, true snubberless performance is possible with no risk to the device.
机译:已经示出了所描述的受控线性放大器提供了安全和可靠的栅极关闭波形,其可以容易地适应于电路条件。低阻抗同轴栅极连接增强了电路的性能,并且与标准的布线方式相比,可以实现更大程度的控制。对于大型GTO,其中的关断电流可能超过3000 A,因此,同轴连接和受控的关断电路都需要可靠的操作。通过使用低于制造商数据表中通常规定的增益,可以确保整个硅区域的器件可靠性和均匀关断。关断增益小于1时,可以实现真正的无缓冲性能,而不会给设备带来任何风险。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号