The Defence Division (DD) of Thorn EMI is currently developing a servo-system for a gimballed transceiver as part of a seeker system to be installed in a missile. In order to enhance the test access at the component, board and assembly levels, the use of boundary scan circuits in an ASIC implementation has been addressed. The purpose of this paper is not to review the detailed benefits which have accrued for the particular application, but to illustrate and expand on the system level test strategies which can be adopted.
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