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IEE Colloquium on Application and Development of the Boundary-Scan Standard

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1.IEE Colloquium on 'Application and Development of the Boundary-Scan Standard' (Digest No.183)

机译：IEE上的“边界扫描标准的应用与开发”的职业讨论会（摘要第183页）
- 作者：Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
2.Boundary scan design for a memory controller

机译：存储器控制器的边界扫描设计
- 作者：Harrod P.L.;Biggs J.P.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
3.Experience of designing JTAG ASICS within System X

机译：在系统X中设计JTAG ASIC的体验
- 作者：Borland A.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
4.ICL's first development using IEEE 1149.1 (JTAG)

机译：ICL首次使用IEEE 1149.1（JTAG）开发
- 作者：Sherratt C.J.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
5.An initial design study of the use of boundary scan to simplify system test (guided weapons)

机译：边界扫描利用简化系统测试的初始设计研究（导武器）
- 作者：Jones T.D.;Millward R.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
6.The IED boundary scan project

机译：IED边界扫描项目
- 作者：Wilkins B.R.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
7.Applications and onward development of ANSI/IEEE Std 1149.1

机译：ANSI / IEEE STD 1149.1的应用和上行发展
- 作者：Maunder C.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年
8.Bridging fault algorithms for a boundary scan board

机译：边界扫描板的桥接故障算法
- 作者：McBean D.;Moore W.;Institute of Electric and Electronic Engineer
- 会议名称：《IEE Colloquium on Application and Development of the Boundary-Scan Standard》 | 1990年