Summary form only given. Design mistakes may appear during the validation steps of integrated circuits. Designers need a machine able to modify the interconnection network in an IC prototype during tests. A repair process by laser direct writing of microstructure was achieved via local decomposition of gases in submicron areas on IC chips. Experimental procedures for conductor (Ni) or insulator (Si/sub 3/N/sub 4/) deposition and microelectronic material (SiO/sub 2/-Al) etching were defined. This work led to a VLSI repair machine gathering all these elementary reactions in one process, allowing designers to modify quickly and efficiently interconnection networks.
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机译:仅提供摘要表格。在集成电路的验证步骤中可能会出现设计错误。设计人员需要一台能够在测试期间修改IC原型中的互连网络的机器。通过激光直接写入微结构的修复过程是通过IC芯片上亚微米区域中气体的局部分解来实现的。定义了导体(Ni)或绝缘体(Si / sub 3 / N / sub 4 /)沉积和微电子材料(SiO / sub 2 / -Al)蚀刻的实验程序。这项工作导致了VLSI维修机器可以在一个过程中收集所有这些基本反应,从而使设计人员可以快速而有效地修改互连网络。
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