首页> 外文会议>Materials Science amp; Technology 2003 Meeting; Nov 9-12, 2003; Chicago, Illinois, USA >TWO PROBLEMS IN LEDGEWISE GROWTH OF FERRITE REQUIRING FURTHER ADVANCED EXPERIMENTAL TECHNIQUES FOR THEIR SOLUTION
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TWO PROBLEMS IN LEDGEWISE GROWTH OF FERRITE REQUIRING FURTHER ADVANCED EXPERIMENTAL TECHNIQUES FOR THEIR SOLUTION

机译:铁素体轻晶生长中的两个问题需要进一步的高级实验技术来解决

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Two major problems that have arisen in studies of the ledgewise growth of ferrite are summarized. Difficult, long-standing questions about the origins and the lateral migration mechanisms of growth ledges may now be addressable with a new technique proposed here: TEM-based Computer Axial Tomography (TEM-CAT). Successful development of this technique would also aid significantly in attacking the second problem: the chemistry of kinks on the risers of growth ledges in Fe-C-X (and more complicated) alloys in which X induces a strong coupled-solute drag effect (C-SDE). A recent investigation in an Fe-C-Mo alloy demonstrated that the Mo detected at α:γ boundaries with the STEM technique, as well as the previously employed techniques of EELS (electron energy loss spectroscopy), 1DAP (one-dimensional field ion atom probe) and 3DAP (three-dimensional field ion microscope atom probe), was associated with segregation to these boundaries during transformation stasis, rather than with accumulation at kinks on growth ledge risers during growth as had long been anticipated. The possibility is raised that the combination of TEM-CAT with further refinement the 3DAP technique may permit the desired measurements to be made.
机译:总结了在铁素体的横向生长研究中出现的两个主要问题。关于生长壁架的起源和横向迁移机制的长期难题,现在可以通过此处提出的新技术解决:基于TEM的计算机轴向断层扫描(TEM-CAT)。该技术的成功开发还将大大有助于解决第二个问题:纠结在Fe-CX(及更复杂)合金中的生长壁上升沿的化学反应,其中X诱导强烈的固溶耦合效应(C-SDE) )。最近在Fe-C-Mo合金中进行的一项研究表明,利用STEM技术以及先前采用的EELS(电子能量损失谱)技术,一维场离子原子技术可在α:γ边界处检测到Mo。探针和3DAP(三维场离子显微镜原子探针)与转化停滞过程中这些边界的偏析有关,而不是与长期以来预期的生长壁架上纽结处的聚集有关。 TEM-CAT与进一步完善的3DAP技术的组合可能允许进行所需的测量。

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