Reliability improvement in 638 nm broad area laser diode

摘要

Reliability of 638-nm broad area laser diode (LD) is basically dominated by catastrophic optical mirror degradation(COMD) at a front facet. The facet and window-mirror structure as a measure to COMD of 638-nm broad area triple emitter wererevised to achieve highly-reliable operation under high output power. The improved LD showed very stable operation up to 5,000hours under operation current of 4.9 A (initial output of 4.75 W), CW without any COMD failure, indicating that the mean time tofailure due to COMD exceeding 8,100 hours under the condition. It was approximately 3.3 times of our former LD.