Novel application of the OBIRCh amplifier for timing failure localization

摘要

Soft defects localization by laser techniques on dynamicallyrnworking ICs is widely used for Failure Analysis (FA). In thisrncontext, many AC signal-oriented analysis methods have beenrnintroduced to date (SDL, LADA…) or are under developmentrn(xVM…). Sophisticated tools are available to localize thesernkinds of failures but not every FA laboratory has them. Byrnfully exploiting the capabilities of static localization tools, it isrnpossible to deal with timing issues. In this paper, we propose arnnovel application of the OBIRCh amplifier related to therntiming issues on a real case study (mixed-mode device). Thisrnnovel and very simple application makes the analysis flowrntime-attractive and enlarges the application field of mappingrntechniques on the existing tools.