首页> 外文会议>International Symposium for Testing and Failure Analysis(ISTFA 2004); 20051106-10; San Jose,CA(US) >Methodology of optimum-kV BSE application in SEM and summary of characteristic for low energy SEM/EDS/FIB
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Methodology of optimum-kV BSE application in SEM and summary of characteristic for low energy SEM/EDS/FIB

机译:最佳kV BSE在SEM中的应用方法以及低能SEM / EDS / FIB的特性摘要

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摘要

Advantages of low energy e-beam & i-beam, in the operation and applications of SEM/FIB/EDS are presented. Further advantages of Backscattered Electron in SEM are stressed in the paper. However, since the "low energy" limit of zero is impractical, limiting factors and optimum operation conditions will be discussed. The article also investigates practical challenges associated with low energy beams in real situations.
机译:提出了低能电子束和电子束在SEM / FIB / EDS的操作和应用中的优势。本文强调了SEM中反向散射电子的其他优点。然而,由于零的“低能量”极限是不切实际的,因此将讨论限制因素和最佳操作条件。本文还研究了在实际情况下与低能量束相关的实际挑战。

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