首页> 外文会议>International Symposium on Solid-State Ionic Devices III and 202nd Electrochemical Society Meeting Oct 20-24, 2002 Salt Lake City >DIFFUSION COEFFICIENT IN CaAl_(12)O_(19) BY SOLID-STATE REACTION AND IONIC CONDUCTIVITY MEASUREMENT
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DIFFUSION COEFFICIENT IN CaAl_(12)O_(19) BY SOLID-STATE REACTION AND IONIC CONDUCTIVITY MEASUREMENT

机译:固相反应和离子电导率测量在CaAl_(12)O_(19)中的扩散系数

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The growth of CaAl_(12)O_(19) in diffusion couples of single crystal Al_2O_3 and poly-crystalline CaAl_4O_7 was investigated between 1573 and 1823 K. The growth rate of CaAl_(12)O_(19) obeyed a parabolic rate law. CaAl_(12)O_(19) was reported to have a layered structure composed of alternating layers of spinel block and ionically conductive layers. Electrical conductivity measurements indicated major defects in CaAl_(12)O_(19) to be interstitial oxide ion and calcium ion on the conduction layers. Diffusion coefficients of oxide ion and calcium ion in CaAl_(12)O_(19) were determined between 1123 and 1823 K.
机译:在1573至1823 K之间研究了CaAl_(12)O_(19)在单晶Al_2O_3和多晶CaAl_4O_7扩散对中的生长。CaAl_(12)O_(19)的生长速率服从抛物线速率定律。据报道,CaAl_(12)O_(19)具有由尖晶石嵌段和离子导电层的交替层组成的层状结构。电导率测量表明,CaAl_(12)O_(19)中的主要缺陷是导电层上的间隙氧化物离子和钙离子。在1123和1823 K之间确定CaAl_(12)O_(19)中氧化物离子和钙离子的扩散系数。

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