首页> 外文会议>The International Symposium in Honor of Professor Norio Sato: Passivity and Localized Corrosion, Oct 17-22, 1999, Hawaii >THE INFLUENCE OF HEAT ON THE MEASUREMENT OF PHOTOCURRENT AT THE ANODIC FILM OF NICKEL ELECTRODE
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THE INFLUENCE OF HEAT ON THE MEASUREMENT OF PHOTOCURRENT AT THE ANODIC FILM OF NICKEL ELECTRODE

机译:热量对镍电极阳极膜上光电流测量的影响

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摘要

The influence of heat on the measurement of photocurrent for nickel electrode in 1M NaOH solution was investigated by using photocurrent, photothermal and thermal current methods. It was found that under the light irradiation the photocurrent appeared in the Ni(OH)_2/ NiOOH redox potential region should be mainly attributed to the influence of heat, instead of the semiconductor properties of the anodic layer. It should be considered that during the irradiation of light the increase of temperature at the surface of working electrode might disturb the photocurrent measurement.
机译:通过光电流,光热和热电流方法研究了热对1M NaOH溶液中镍电极光电流测量的影响。发现在光照射下,Ni(OH)_2 / NiOOH氧化还原电势区域中出现的光电流应主要归因于热的影响,而不是阳极层的半导体特性。应该考虑的是,在光照射期间,工作电极表面温度的升高可能会干扰光电流测量。

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