首页> 外文会议>International Display Manufacturing Conference amp; FPD Expo 2007(IDMC'07); 20070703-06; Taipei(CT) >Investigation of Electrical Pulse Erasing Method Effect on Current-Voltage Characteristics of Organic Bistable Device
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Investigation of Electrical Pulse Erasing Method Effect on Current-Voltage Characteristics of Organic Bistable Device

机译:电脉冲擦除方法对有机双稳态器件电流电压特性影响的研究

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摘要

The electrical characteristics of the organic bistable devices with AI/Alq_3-type Si structure with an electrical pulse erasing method are investigated. The bistable characteristic similar to that of metal/organic semiconductor/metal structure is demonstrated as well. Furthermore, generation of extra defects at both interfaces introduces variations on the electrical behaviors when erasing voltage conditions are applied on the organic bistable device. This device shows extremely easy fabrication processes and great potential in future advanced organic display.
机译:利用电脉冲擦除方法研究了具有AI / Alq_3 / n型Si结构的有机双稳态器件的电学特性。还证明了类似于金属/有机半导体/金属结构的双稳态特性。此外,当在有机双稳态器件上施加擦除电压条件时,在两个界面上都会产生额外的缺陷,从而引起电性能的变化。该器件显示出极其简单的制造工艺,并且在未来的高级有机显示器中具有巨大的潜力。

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