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Preparation of Polycrystalline HgI_2 Films by PVD method under Ultrasonic Wave

机译:超声下PVD法制备HgI_2多晶薄膜

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摘要

Highly oriented polycrystalline α-HgI_2 thick films are fabricated by physical vapor deposition method under the conditions of 59KHz ultrasonic wave and relatively lower source temperature of 80℃. The ultrasonic wave is used in the process of physical vapor deposition films preparation for the first time. With the effect of ultrasonic wave, the film quality and the growth rate can be obviously improved. The growth mechanism as well as impacts of ultrasonic wave is also discussed.
机译:采用物理气相沉积法,在59KHz超声波和80℃较低源温度下,制备了高取向多晶α-HgI_2厚膜。超声波首次用于物理气相沉积膜的制备过程中。在超声波的作用下,薄膜质量和生长速度可以得到明显改善。还讨论了超声波的生长机理以及影响。

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