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The influence of process variables on the microstructure and electrical properties of low-voltage ZnO varistor

机译:工艺变量对低压ZnO压敏电阻微结构和电性能的影响

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摘要

The effects of process variables, such as sintering temperature, cooling rate, calcination, baling time on the microstructure and electrical properties of the low voltage ZnO varistor have been investigated. There exists a maximum sintering temperature when the breakdown field is the lowest. The results provide information about the grain size control to fabricate low voltage ZnO varistor, as well as the relationship between the microstructure and the varistor performance. We sicussed the sintering temperature dependence of breakdown field in terms of the formation rate of gain core and grain growth rate.
机译:研究了烧结温度,冷却速率,煅烧,打包时间等工艺变量对低压ZnO压敏电阻的微观结构和电性能的影响。当击穿场最低时,存在最高的烧结温度。结果提供了有关制备低压ZnO压敏电阻的粒度控制以及微结构和压敏电阻性能之间关系的信息。从增益核心的形成速率和晶粒的生长速率两个方面来探讨击穿场的烧结温度依赖性。

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