首页> 外文会议>International Conference on Defects in Semiconductors; 20050724-29; Awaji Island(JP) >Understanding the Jahn-Teller distortions for the divacancy and the vacancy-group-V-atom pair in silicon
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Understanding the Jahn-Teller distortions for the divacancy and the vacancy-group-V-atom pair in silicon

机译:了解硅中空位和空位-V-原子对的Jahn-Teller畸变

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摘要

The Jahn-Teller (JT) distortions of the divacancy and the vacancy-group-V-atom pair in silicon are treated within a simple one-electron molecular orbital model associated with the dangling orbitals surrounding each vacancy. Properly instrumented, it predicts not only the correct sense of the distortion for the different charge states of the defects, but also provides a quantitative estimate of the magnitude of the JT distortions and the barriers for reorientation of each.
机译:硅中空位和空位-V-原子对的Jahn-Teller(JT)畸变在与围绕每个空位的悬空轨道相关的简单单电子分子轨道模型中进行处理。正确地仪器化,它不仅可以预测缺陷不同电荷状态的正确畸变感,而且可以定量估算JT畸变的大小以及每种畸变的重新定位的障碍。

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