An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential?

机译：使用硅漂移检测器对X射线映射/成像以及存在的伪像进行调查-采集后的堆积校正是否必不可少？

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《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|890-891|共2页
会议地点 Nashville, TN(US)
作者
B. J. Griffin; D.C. Joy; J. R. Michael; J.R. Muhling;
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Centre for Microscopy Characterization and Analysis The University of Western Australia Crawley WA Australia 6009;

Center for NanoPhase Materials Science Oak Ridge National Laboratory Oak Ridge TN 37831;

Sandia National Laboratories PO Box 5800 Albuquerque NM 87185-0886;

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1. The new X-ray mapping: X-ray spectrum imaging above 100 kHz output count rate with the silicon drift detector [J] . Newbury DE Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2006,第1期

机译：新的X射线映射：使用硅漂移检测器以100 kHz以上的输出计数率对X射线光谱成像
2. X-ray Spectrometry and Spectrum Image Mapping at Output Count Rates above 100 kHz with a Silicon Drift Detector on a Scanning Electron Microscope [J] . Dale E. Newbury Scanning . 2005,第5期

机译：使用扫描电子显微镜上的硅漂移检测器以高于100 kHz的输出计数速率进行X射线光谱和光谱图像映射
3. Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector [J] . Ritchie N.W.M., Newbury D.E., Lindstrom A.P. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2011,第6期

机译：用硅漂移检测器测量的电子激发X射线光谱中的康普顿散射伪像
4. A new life for the wavelength-dispersive X-ray spectrometer (WDS): incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping [C] . R Wuhrer, K Moran European Workshop on Modern Developments and Applications in Microbeam Analysis . 2018

机译：波长分散X射线光谱仪（WDS）的新寿命：将硅漂移检测器掺入WDS中，以改善量化和X射线映射
5. Sparse image reconstruction and artifact correction of multi-dimensional spectroscopic imaging data. [D] . Burns, Brian Loren. 2014

机译：多维光谱成像数据的稀疏图像重建和伪影校正。
6. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) [O] . Dale E. Newbury, Nicholas W. M. Ritchie -1

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析
7. The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz [O] . D E Newbury 2005

机译：新的X射线映射：将硅漂移探测器（SDD）应用于X射线光谱和频谱成像，输出计数超过100kHz

An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential?

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