The origin of crack surface instabilities in silicon crystal

摘要

Previous investigations showed micron scale height corrugations instabilities on the fracture surface of (111) low energy cleavage plane of silicon, when the crack was propagated in the direction at speed below 1100 m·s-1. These corrugations were evident in three point bending and tensile experiments, and resemble fluctuations on the (111) and (110) low energy cleavage planes, propagating along the intersection line of both planes.