In this paper, the conventional E_n - I_n noise model used for low frequency low noise electronic design is analyzed. Thus an improved E_n - I_n noise model with spectral correlative coefficient (S.C.C.) has been proposed, which can be used for the case of a source impedance. Then, the two important properties of S.C.C. are introduced. In the end, the measurement approach and the accuracy of S.C.C. are discussed, and the measurement results for a commercial transistor are given.
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