TEST METHODOLOGY FOR EMBEDDED SYSTEM-ON-CHIP (SOC) WITHMIXED-SIGANAL AND ANALOG CORES

摘要

Recently, approach to developing test methodologiesrnfor analog and mixed-signal embedded cores-basedrnsystem-on-chip (SOC) with built-in hardware wasrnproposed by the current authors. In particular, oscillationbasedrnbuilt-in self-test (OBIST) methodologies for testingrnanalog parts in mixed-signal circuits were explored. Arnmajor advantage of OBIST methods is that they do notrnrequire either stimulus generators or complex responsernanalyzers, which makes them suitable for testing analogrncircuits in mixed-signal system-on-chip (SOC)rnenvironments. In this paper, analog and mixed-signalrncircuit test techniques based on the principle of OBISTrnwere further studied, and more simulation results onrnanalog and mixed-signal benchmark circuits are providedrnto augment and emphasize the significance of thernproposed implementations.