Application of scanning tunneling microscope to high-speed optical sampling measurement

摘要

A novel method for a measurement of a high-speed electrical waveform using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photo-conductive switch on the STM probe to measure a high-speed signal in an equivalent sampling procedure. The temporal resolution of 160 ps has been achieved. This method has the potential to create a breakthrough in ultra high-speed waveform measurement through this unique combination of optical sampling and STM technology.