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Design and characterization of a four-quadrant detector and its application to shape recovering system

机译:四象限探测器的设计与表征及其在形状恢复系统中的应用

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This work describes the characterization of a quadrant-type silicon photodiode that detect visible light and is designed using CMOS integrated circuit technology, peaking in 550 nm wavelength. The quadrant detector (QD) derives photocurrents by projecting a spot of light on four photodiodes placed close to each other on a silicon common substrate. The photodetector is square shaped with 2.25 mm~2 per active area by each quadrant and the size of the device is 9mm~2. Its transition region between the adjacent cells had a narrow width of 30 μm. The technology to develop position sensitive detectors of four quadrant optimizing geometry to increase sensitivity is described. In addition, the performance on applying the QD to shape a recovering system is investigated.
机译:这项工作描述了可检测可见光的象限型硅光电二极管的特性,并使用CMOS集成电路技术进行了设计,峰值波长为550 nm。象限检测器(QD)通过将光点投射到在硅公共基板上彼此相邻放置的四个光电二极管上来投射光电流。光电探测器为方形,每个象限的每个有效面积为2.25 mm〜2,装置的尺寸为9mm〜2。它在相邻单元之间的过渡区域具有30μm的窄宽度。描述了开发具有四个象限优化几何形状以提高灵敏度的位置敏感检测器的技术。此外,还研究了将QD应用于成形回收系统的性能。

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