National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, CA 94720;
Department of Materials Science and Engineering University of Virginia, Charlottesville, VA 22903;
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;
Department of Electrical Engineering, University of Virginia, Charlottesville, VA 22903;
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机译:Ge / Si异质结构中位错的应变场映射
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