首页> 外文会议>III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics >QUANTITATIVE EXPERIMENTAL DETERMINATION OF THE EFFECT OF DISLOCATION - DISLOCATION INTERACTIONS ON STRAIN RELAXATION IN LATTICE MISMATCHED HETEROSTRUCTURES
【24h】

QUANTITATIVE EXPERIMENTAL DETERMINATION OF THE EFFECT OF DISLOCATION - DISLOCATION INTERACTIONS ON STRAIN RELAXATION IN LATTICE MISMATCHED HETEROSTRUCTURES

机译:错位-错位相互作用对晶格错位异质结构中应变松弛的影响的定量实验测定。

获取原文
获取原文并翻译 | 示例

摘要

We present real time observations of the interaction of dislocations in heteroepitaxial strained layers using a specially modified ultrahigh vacuum transmission electron microscope equipped with in-situ deposition capabilities. These observations have led to delineation of the regime of epilayer thickness and composition where dislocation interactions result in blocking of the propagating threading segment. It is found that both the blocking probability as well as the magnitude of the dislocation interaction force are strongly dependent on the Burgers vectors of the dislocations involved, with the greatest effects observed when the Burgers vectors of the two dislocations are parallel with respect to each other. Frame-by-frame analysis of the motion of the dislocation threading segment during interaction is used to extract the magnitude of the interaction stresses as a function of both the level of heteroepitaxial strain and the dislocation geometry. Finally, by continuing growth following observations of blocking during annealing, we find that blocked dislocations are likely to remain in that configuration until substantial additional heteroepitaxial stresses are incorporated into the layer. These results have direct relevance to the successful integration of strained layer heterostructures into electronic device applications. This is because blocked threading segments result in the introduction of undesired band gap states, enhance impurity diffusion, modify surface morphology and act to limit the dislocation density reductions achievable in graded buffer structures.
机译:我们使用配备有原位沉积功能的特制超高真空透射电子显微镜,对异质外延应变层中位错的相互作用进行实时观察。这些观察结果导致描述了外层厚度和组成的状态,其中位错相互作用导致传播螺纹段的阻塞。发现阻塞位错以及位错相互作用力的大小都强烈取决于所涉及位错的Burgers向量,当两个位错的Burgers向量彼此平行时观察到的影响最大。 。相互作用过程中位错螺纹段运动的逐帧分析用于提取相互作用应力的大小,该应力是异质外延应变水平和位错几何形状的函数。最后,通过观察退火过程中发生的阻塞后继续生长,我们发现阻塞的位错很可能会保留在该构型中,直到将大量附加的外延应力并入该层中为止。这些结果与应变层异质结构成功集成到电子设备应用程序中直接相关。这是因为阻塞的螺纹段导致引入不希望的带隙状态,增强杂质扩散,改变表面形态并起到限制梯度缓冲结构中可实现的位错密度降低的作用。

著录项

  • 来源
  • 会议地点 Boston MA(US)
  • 作者单位

    National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, CA 94720;

    Department of Materials Science and Engineering University of Virginia, Charlottesville, VA 22903;

    IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;

    IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;

    IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598;

    Department of Electrical Engineering, University of Virginia, Charlottesville, VA 22903;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 金属材料;
  • 关键词

  • 入库时间 2022-08-26 14:20:06

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号