首页> 外文会议>IEEE Symposium on VLSI Circuits >An All-Digital Unified Clock Frequency and Switched-Capacitor Voltage Regulator for Variation Tolerance in a Sub-Threshold ARM Cortex M0 Processor
【24h】

An All-Digital Unified Clock Frequency and Switched-Capacitor Voltage Regulator for Variation Tolerance in a Sub-Threshold ARM Cortex M0 Processor

机译:用于亚阈值ARM Cortex M0处理器的变化容差的全数字统一时钟频率和开关电容稳压器

获取原文

摘要

An all-digital switched-capacitor (SC) based clock frequency (Felk) and supply voltage (V dd) regulator unifies Fclk and Vdd generation into a single control loop to reduce the V dd margin for variations in a sub-threshold ARM Cortex M0 processor. This fully-integrated unified clock and power (Uni-CaP) architecture allows continuous Vdd scalability without a low-dropout (LDO) regulator. Measurements from a 65nm test chip demonstrate a 16% Vdd reduction (94% Vdd margin recovery) and a 3.2× increase in Fclk operating range.
机译:基于全数字开关电容器(SC)的时钟频率(Felk)和电源电压(Vdd)调节器将Fclk和Vdd生成统一到单个控制环路中,以减小亚阈值ARM Cortex M0中Vdd裕度的变化处理器。这种完全集成的统一时钟和电源(Uni-CaP)架构可实现连续的Vdd可扩展性,而无需低压差(LDO)调节器。在65nm测试芯片上进行的测量表明,Vdd降低了16%(Vdd余量恢复率为94%),Fclk工作范围提高了3.2倍。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号