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A low latency simultaneous quantization Vernier delay-line-based ADC for digital control single-inductor-multiple-output DC-DC converter

机译:用于数字控制单电感多输出DC-DC转换器的低延迟同时量化基于游标延迟线的ADC

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A low latency Vernier delay-line-based window ADC capable of simultaneous quantization for digital control single-inductor-multiple-output (SIMO) DC-DC converter is proposed in this work. The ADC converts signals of feedback voltages and sensed inductor current by voltage-time converter (VTC) and successive time-digital converter (TDC). Together with a subrange quantization scheme, a preceding interleaving Vernier delay line method is proposed in the TDC, which offers 7bits resolution for each channel and makes the latency of A/D conversion lower than 5ns. Moreover, benefited from the TDC architecture, MSB and LSB time references generated by delay line are shared with all channels, which reduce the amounts of delay line as well as matching difficulty and power consumption. As a result, it is suitable for the application requiring multiple channels and low conversion latency. The proposed ADC is designed in 0.18μm CMOS process and provides 6 quantization channels for a digital control SIMO DC-DC converter which regulates four output voltages to 1.8V, 2.5V, 3.3V and 5V individually.
机译:在这项工作中,提出了一种能够同时量化数字控制单电感器多输出(SIMO)DC-DC转换器的低延迟,基于Vernier延迟线的窗口ADC。 ADC通过电压时间转换器(VTC)和连续时间数字转换器(TDC)转换反馈电压和感测到的电感器电流的信号。与子范围量化方案一起,在TDC中提出了一种先前的交错Vernier延迟线方法,该方法为每个通道提供7位分辨率,并使A / D转换的延迟低于5ns。此外,得益于TDC架构,延迟线生成的MSB和LSB时间参考与所有通道共享,从而减少了延迟线的数量以及匹配难度和功耗。因此,它适用于需要多个通道和低转换延迟的应用。拟议的ADC采用0.18μmCMOS工艺设计,并为一个数字控制SIMO DC-DC转换器提供6个量化通道,该转换器将四个输出电压分别调节至1.8V,2.5V,3.3V和5V。

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