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AlGaN-based deep ultraviolet light emitting diodes with reflection layer

机译:具有反射层的基于AlGaN的深紫外发光二极管

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We report on the effect of reflection layer on electrical and optical characteristics of AlGaN-based multiple-quantum well deep-UV flip chip light-emitting diodes. Relatively thick Al metal as a reflector layer was deposited on the p-contact of deep-UV LEDs by e-beam evaporator at a nominal chamber pressure of 2 × 10~(-6) mtorr. AlGaN-based flip chip deep-UV LEDs using Ni/Au/Al/Ti/Au composite reflection layers exhibited a significant improvement in their optical output power and extraction efficiencies. Efforts have also been involved to improve the reflection properties of the packaged devices without increase their forward voltages. Present results suggest that, for efficient deep-UV flip chip LEDs, the deposited Al-reflection layer should have an optimal thickness of ≥ 200 nm.
机译:我们报告反射层对基于AlGaN的多量子阱深紫外倒装芯片发光二极管的电学和光学特性的影响。相对较厚的铝金属作为反射层通过电子束蒸发器在2×10〜(-6)mtorr的标称腔压力下沉积在深紫外LED的p触点上。使用Ni / Au / Al / Ti / Au复合反射层的基于AlGaN的倒装芯片深紫外LED在其光输出功率和提取效率方面表现出显着改善。还努力在不增加其正向电压的情况下改善封装器件的反射特性。目前的结果表明,对于有效的深紫外倒装芯片LED,沉积的Al反射层的最佳厚度应≥200 nm。

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