首页> 外文会议>Fundamental Physics of Ferroelectrics 2002 Workshop, Feb 3-6, 2002, Washington DC >Lattice Dynamics In Ba_xSr_(1_x)TiO_3 Thin Films Studied By Raman Spectroscopy
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Lattice Dynamics In Ba_xSr_(1_x)TiO_3 Thin Films Studied By Raman Spectroscopy

机译:拉曼光谱研究Ba_xSr_(1_x)TiO_3薄膜的晶格动力学

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Thin films of Ba_xSr_(1-x)TiO_3 with Ba contents x = 0.05,0.1, 0.2 and 0.5, grown by pulsed laser deposition on SrTiO_3 and LaAlO_3 substrates with SrRuO_3 buffer layers, were studied by Raman spectroscopy. Soft phonon modes were observed, and the temperature behavior of their frequencies and Raman intensities in the range from 5 to 300 K was investigated. The temperature dependence of the soft phonon frequencies and the splitting of the triply degenerated soft mode of the cubic phase into two components of A and E symmetries indicate the ferroelectric phase transition. The E soft mode line is clearly seen in Raman spectra at temperatures away from the ferroelectric phase transition, but it becomes overdamped over a broad range of temperatures around the phase transition. The relative Raman intensity of hard phonon modes as well as the A soft mode decreases gradually with increasing the temperature over abroad range of temperatures. This indicates that the ferroelectric phase transition in the thin films is thermally broadened. Comparison of Raman data for films grown on SrTiO_3 and LaAlO_3 substrates shows the influence of strain on the temperature of the ferroelectric phase transition.
机译:通过拉曼光谱研究了在具有SrRuO_3缓冲层的SrTiO_3和LaAlO_3衬底上通过脉冲激光沉积生长的Ba含量为x = 0.05、0.1、0.2和0.5的Ba_xSr_(1-x)TiO_3薄膜。观察到软声子模式,并研究了其频率和拉曼强度在5至300 K范围内的温度行为。软声子频率的温度依赖性以及三次相的三次退化软模式分裂为A和E对称的两个分量表示铁电相变。在远离铁电相变的温度下,在拉曼光谱中可以清楚地看到E软模式线,但在相变附近的宽温度范围内,E软模式线会被过度阻尼。在国外温度范围内,随着温度的升高,硬声子模式和A软声子模式的相对拉曼强度逐渐降低。这表明薄膜中的铁电相变被热加宽。比较在SrTiO_3和LaAlO_3衬底上生长的薄膜的拉曼数据,可以看出应变对铁电相变温度的影响。

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