The Failure Investigations on the Thin Film Interface under the Dynamic Loading

摘要

The film spallation, a typical film / substrate failure style, could be caused by many reasons. The strong impact on the film/substrate can also lead to this failure phenomenon. So the film spallation induced by the strong impact is explored in this paper. Here the strong impact comes from the laser-driven flyer loading, hi the numerical simulating process, the Finite Element Method (FEM) and Johnson-Cook material constitutive model have been used, moreover, some ideal film spallation results were got, which are helpful for us to understand this failure phenomenon.