ON THE GROWTH, MICROSTRUCTURE AND PROPERTIES OF TiN AND TiC WHISKER-LIKE CRYSTALS

摘要

TiN and TiC whisker-like crystals with maximum length 8 mm and diameter 500 μm were obtained by Chemical Vapour Deposition (CVD) on various substrates at a temperature from 950-1450℃. In the case of TiN and TiC whiskers obtained on substrates doped with Ni it was found that in the initial stage their growth took place via the Vapour-Liquid-Solid (VLS) mechanism. Crystallographic orientation of TiN and TiC whisker-like crystals growth axis and the Mueller indices of their side faces were determined by X-ray rotation and Laue methods and also measurement of angles between whisker faces with a two circle reflection goniometer. All the whiskers were found to be single crystals. They exhibited various growth directions, most often [111], [110] and [001]. The microstructure of as-grown TiN and TiC whiskers was examined using Lang X-ray topography, transmission electron microscopy (TEM) and also the Eshelby measurement of the twist of the crystal lattice. Tensile strength, Vickers microhardness and electrical resistivity of TiN and TiC whiskers was determined.