首页> 外文会议>Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics >Correlation of the characteristics of MIS structures and stoichiometry disturbances of Hg1-xZnxTe
【24h】

Correlation of the characteristics of MIS structures and stoichiometry disturbances of Hg1-xZnxTe

机译:Hg1-xZnxTe的MIS结构特征与化学计量扰动的相关性

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Abstract: The composition of subsurface region MZT has been studied using Rutherford backscattering spectroscopy (RBS) ions helium. Interrelation of the electrical properties of MIS structures with the result of RBS have been determinated. It is found that the effective surface charge is connected with composition stoichiometry variation of subsurface region semiconductor. !5
机译:摘要:利用卢瑟福背散射光谱(RBS)离子氦气研究了亚表面区域MZT的组成。已经确定了MIS结构的电性能与RBS结果的相互关系。发现有效表面电荷与地下区域半导体的组成化学计量变化有关。 !5

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号