首页> 外文会议>Focal Plane Arrays for Space Telescopes III; Proceedings of SPIE-The International Society for Optical Engineering; vol.6690 >Comparing the low-temperature performance of megapixel NIR InGaAs and HgCdTe imager arrays
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Comparing the low-temperature performance of megapixel NIR InGaAs and HgCdTe imager arrays

机译:百万像素NIR InGaAs和HgCdTe成像器阵列的低温性能比较

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We compare a more complete characterization of the low temperature performance of a nominal 1.7um cut-off wavelength 1k×1k InGaAs (lattice-matched to an InP substrate) photodiode array against similar, 2k×2k HgCdTe imagers to assess the suitability of InGaAs FPA technology for scientific imaging applications. The data we present indicate that the low temperature performance of existing InGaAs detector technology is well behaved and comparable to those obtained for state-of-the-art HgCdTe imagers for many space astronomical applications. We also discuss key differences observed between imagers in the two material systems.
机译:我们比较了标称1.7um截止波长1k×1k InGaAs(晶格匹配InP衬底)光电二极管阵列与类似的2k×2k HgCdTe成像仪的低温性能的更完整表征,以评估InGaAs FPA的适用性科学成像应用的技术。我们提供的数据表明,现有InGaAs检测器技术的低温性能良好,并且可与许多太空天文应用中的最新HgCdTe成像仪获得的低温性能相媲美。我们还将讨论两种材料系统中成像仪之间观察到的关键差异。

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