首页> 外文会议>Conference on Focal Plane Arrays for Space Telescopes >Comparing the low-temperature performance of megapixel NIR InGaAs and HgCdTe imager arrays
【24h】

Comparing the low-temperature performance of megapixel NIR InGaAs and HgCdTe imager arrays

机译:比较Megapixel Nir ​​Ingaas和HGCDTE成像阵列的低温性能

获取原文

摘要

We compare a more complete characterization of the low temperature performance of a nominal 1.7um cut-off wavelength 1kx1k InGaAs (lattice-matched to an InP substrate) photodiode array against similar, 2kx2k HgCdTe imagers to assess the suitability of InGaAs FPA technology for scientific imaging applications. The data we present indicate that the low temperature performance of existing InGaAs detector technology is well behaved and comparable to those obtained for state-of-the-art HgCdTe imagers for many space astronomical applications. We also discuss key differences observed between imagers in the two material systems.
机译:我们比较了标称1.7um截止波长1KX1K InGaAs(晶格匹配到INP基板)光电二极管阵列的低温性能的更完整表征,相对于类似的2KX2K HGCDTE成像仪,以评估InGaAs FPA技术进行科学成像的适用性应用程序。我们所示的数据表明,现有的InGaAs检测器技术的低温性能表现良好并且与用于许多空间天文应用的最先进的HGCDTE成像仪所获得的那些。我们还讨论了两种材料系统中的成像器之间观察到的关键差异。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号