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New 3D surface profile measurement based on phase-shift interfering technology

机译:基于相移干涉技术的新型3D表面轮廓测量

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摘要

Abstract: This paper describes a kind of profiler with the above features. It uses the white-light interfering method and adopts the structure of Micelson interferometer. It includes the light bulb used as the light resource, CCD used as the sensor, PZT providing microscopic translating and the computer sampling and processing data with high speed. When the reference-mirror translating, computing and comparing the modulation M of each point of the surface will give their relative surface height. Then we obtain the surface profile of object to be measured.!3
机译:摘要:本文描述了一种具有上述功能的探查器。它采用白光干涉法,并采用了米塞尔森干涉仪的结构。它包括用作光源的灯泡,用作传感器的CCD,提供微观翻译的PZT以及计算机高速采样和处理数据。当参考镜平移,计算和比较表面每个点的调制M时,将给出它们的相对表面高度。然后我们获得要测量的物体的表面轮廓!! 3

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