A Semi-Analytical Approach to the Solution of Event Sequence Diagrams

摘要

Dynamic reliability problems, due to their complexity are very difficult to solve in closed form. In most cases it may be impossible to obtain closed form solutions. The Event Sequence Diagram (ESD) framework can qualitatively represent dynamic scenarios. The mathematical formulation of the ESD framework defines the equations for the various components of the framework. In this paper, these equations are integrated using a symbolic manipulation software to obtain analytical solutions for the scenarios (whenever the antiderivative exists). This is illustrated on a well-known dynamic reliability problem, an accidental transient of the primary side of the fast reactor Europa.