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Demonstration of Hydrogen Effects on ZnO LEDs in Current-Voltage and Electroluminescence Characteristics

机译:在电流电压和电致发光特性中证明氢对ZnO LED的影响

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摘要

Hydrogen effects on the electrical and optical properties of p-i-n ZnO light emitting diodes (LEDs) were investigated. There were no diode characteristics or light emission observed unless the structures were annealed at 350 ℃ after fabrication. Annealed diodes showed band-edge electroluminescence (385nm) and a broad defect band with a peak at 930nm at room temperature. A hydrogen plasma was used to deliberately introduce hydrogen into the annealed p-i-n ZnO LEDs to verify its effects on diode characteristics. With hydrogen plasma treatment, the diode reverse-bias leakage current increased and both the turn-on voltage and the intensity of the electroluminescence decreased. Moreover, the effects of moisture, water, and phosphoric acid solution on the annealed diode characteristics were also investigated and significant degradation of electrical and optical properties were observed in all cases. These results point to the sensitivity of ZnO LEDs to processing conditions and measurement ambient.
机译:研究了氢对p-i-n ZnO发光二极管(LED)的电学和光学性能的影响。除非结构在制造后在350℃退火,否则没有观察到二极管特性或发光。退火二极管显示出带边电致发光(385nm)和宽缺陷带,在室温下其峰值在930nm。使用氢等离子体将氢故意引入退火的p-i-n ZnO LED中,以验证其对二极管特性的影响。通过氢等离子体处理,二极管的反向偏置泄漏电流增加,并且开启电压和电致发光强度均降低。此外,还研究了水分,水和磷酸溶液对退火二极管特性的影响,并且在所有情况下均观察到电性能和光学性能的显着降低。这些结果表明ZnO LED对处理条件和测量环境的敏感性。

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