首页> 外文会议>Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2011 IEEE >Modeling carbon nanotube bundles for future on-chip nano-interconnects
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Modeling carbon nanotube bundles for future on-chip nano-interconnects

机译:为未来的片上纳米互连建模碳纳米管束

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摘要

In this paper we study the electrical and thermal behaviour of future on-chip interconnects, where carbon nanotube bundles are assumed to replace conventional materials in realizing vertical vias. The model adopted here describe the bundles through a circuit equivalent representation, whose parameters takes into account the effect of size, chirality and temperature of the carbon nanotubes. This allows modelling accurately the typical operating conditions for on-chip interconnects. A 12-layer on-chip interconnect is analysed here, referred to the 22 nm technology node, and three possible scenarios are compared: a conventional copper realization and two hybrid realizations, where the horizontal traces are made by copper or by graphene nanoribbons.
机译:在本文中,我们研究了未来片上互连的电学和热学行为,其中假定碳纳米管束可替代传统材料以实现垂直通孔。此处采用的模型通过电路等效表示来描述束,其参数考虑了碳纳米管的尺寸,手性和温度的影响。这样就可以准确地建模片上互连的典型工作条件。这里分析了一个称为22 nm技术节点的12层片上互连,并比较了三种可能的情况:传统的铜实现和两种混合实现,其中水平走线由铜或石墨烯纳米带制成。

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